BACKGROUND:
Notice is hereby given by the University of Ottawa of the intent to enter into a contract with Quantum Design Inc. to procure a Physical Property Measurement System (PPMS), with a 14 Tesla cryogen-free magnet with the ability to measure electrical and magnetic properties.
PROCESS:
Suppliers that consider their equipment functional, successfully tested, readily available and fully compliant to the ACAN minimum requirements may submit, in writing, a statement of specifications to the contact person identified in this Notice, on or before the closing date of this Notice. In the statement of specifications, the supplier must unequivocally demonstrate how their equipment, at minimum, equals, or exceeds the stated requirements. If no other supplier submits a statement of specifications, on or before the closing date of this Notice, the competitive requirements of the University of Ottawa will be considered having been met. Following notification to any suppliers not successful in unequivocally demonstrating that their statement of specifications equals or exceeds the requirements set out in this Notice, the contract may then be awarded to the pre-identified supplier.
Date of issue: March 13, 2020
Closing Date: April 8, 2020, at 3:00:00 P.M. Eastern Standard Time
INTENDED USE:
The field of materials chemistry research is reliant on not only synthesis of chemical compounds with desirable physical properties, but also on instruments that can quickly and accurately determine how these materials behave under different external stimuli (light, temperature, magnetic field, pressure, etc.). Furthermore, certain properties only start to reveal themselves under extreme conditions (very low temperatures, very high pressures), so the ability to probe these subtle phenomena in order to better understand these systems is vital to tap into their potential. Consequently, the research program requires sensitive instrumentation for measuring the physical and magnetic properties of a variety of chemical compounds as a function of applied magnetic field, temperature, and other stimuli (light, pressure, etc.). Therefore, the University of Ottawa intent to acquire a Physical Property Measurement System (PPMS), with a 14 Tesla cryogen-free magnet with the ability to measure electrical and magnetic properties to have the ability to perform the above mentioned researches.
FUNCTIONALITY:
The equipment must conform to the following Minimum Requirements:
Dynacool 14T PPMS System Specifications
- Temperature Range: 1.8 K to 400 K
- Temperature Stability: +/- 0.1% (T < 20 K), +/- 0.02% (T > 20 K)
- Temperature Accuracy: +/- 1%
- Cool Down Time: 40 minutes (from 300 K to stable 1.9 K)
- Field Range: +/- 14 T
- Field Uniformity: +/- 0.01% over 5.5 cm on-axis
- Field Resolution: +/- 0.22 Oe
- Max Field Charging Rate: 200 Oe/s
- Minimum Field Charging Rate: 0.1 Oe/s
- High Vacuum: < 0.1 mTorr
Electrical Transport (ETO) System Specifications (for zero-field)
Resistance [R] (Values refer to standard 4-probe configuration unless otherwise stated)
- Excitation Mode: AC
- Range: 10 μΩ to 10MΩ, 2MΩ to 5GΩ (high-impedance 2-probe)
- Accuracy: +/- 0.1% typical, +/- 0.2% maximum for R > 200 kΩ; +/- 0.2% typical for R ~ 1 MΩ; +/- 2.0% for R < 1GΩ (high-impedance 2-probe); +/- 5.0% typical for R = 5 GΩ (high-impedance 2-probe)
- Sensitivity: 10 nΩ RMS typical
- Frequency Range: 0.1 Hz to 200 Hz (nominal)
- Current Amplitude Range: 100 nA to 100 mA
- Current Amplitude Accuracy: +/- 0.4% at 100 nA drive (improves as amplitude increases)
- Voltage Amplitude Range: 10 mV to 10 V (high-impedance 2-probe)
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
DC Resistivity Specifications (for zero-field)
Resistance [R]
- Excitation Mode: DC
- Range: 10 μΩ to 5 MΩ
- Sensitivity: 15 nV RMS typical
- Current Range: 2 nA to 8 mA
- Compliance Voltage: 4 V, maximum
- Frequency: 5 Hz square wave
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
Pressure Cell (Transport) Specifications
Pressure [P]
- Maximum Sample Pressure: 2.7 GPa
- Maximum Applied Load: 3.0 GPa
- Diameter: 4 mm
- Length: 6 mm
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
Horizontal Rotator (Transport) Specifications:
Angle [θ]
- Range: -10° to 370°
- Angular Step Resolution: 0.0133°/step (standard resolution); 0.0011°/step (high resolution)
- Orientation: Axis of rotation perpendicular to magnetic field axis and puck key
- Backlash: < 10°
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
Vibrating Sample Magnetometer (VSM) Specifications
Magnetic Moment [m]
- Accuracy: +/- 0.5% using 2.8 mm dia. x 4 mm tall cylinder (shape of included Pd reference)
- Noise Floor: < 6.0 x 10-7 emu at 300 K
- Additional Relative Noise: 3.0 x 10-7 emu/T or 0.5%, whichever is greater
- Max Measurable Moment: mmax [emu] = 40/Peak Amplitude [mm]
- Oscillation Amplitude: 0.1 mm to 5 mm peak, 2 mm typical
- Oscillation Frequency: 10 Hz to 60 Hz, 40 Hz typical
- Averaging Time: 0.5 s to 750 s, 1 s typical
- Bore Diameter: 6.3 mm
- Coil Separation: 9 mm
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
Large Bore Coil Set Specifications
Required for use with straw adapters and pressure cells (therefore required for proposed instrument)
- Accuracy: +/- 0.5% using 2.8 mm dia. x 4 mm tall cylinder (shape of included Pd reference)
- Noise Floor: < 1.5 x 10-6 emu at 300 K
- Additional Relative Noise: 3.0 x 10-7 emu/T or 0.5%, whichever is greater
- Max Measurable Moment: mmax [emu] = 75/Peak Amplitude [mm]
- Oscillation Amplitude: 0.1 mm to 5 mm peak, 2 mm typical
- Oscillation Frequency: 10 Hz to 60 Hz, 40 Hz typical
- Averaging Time: 0.5 s to 750 s, 1 s typical
- Bore Diameter: 12 mm
- Coil Separation: 12.2 mm
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
VSM Oven System Specifications
Temperature [T]
- Range: 300 K to 1000 K
- Ramp Rate: Up to 1000 K/min
- Accuracy: +/- 2% after stabilizing
- Stability: +/- 1 K for fields up to 14 T
Magnetic Moment [m]
- Accuracy: +/- 2% or 6 x 10-6 emu, whichever is greater
- Noise Floor: < 6.0 x 10-6 emu at 300 K
- Additional Relative Noise: 5 x 10-7 emu/T or 0.5%, whichever is greater
- Operational Range: 300 K to 1000 K, 0 T to 14 T
Fiber Optic Sample Holder (VSM) Specifications
Magnetic Moment [m]
- Sensitivity: < 1 x 10-4 emu
- Maximum Length: 1.6 mm
- Maximum Diameter: 1.6 mm
- Transmittance: > 60% of 325 nm to 900 nm, UV holder; > 60% of 375 nm to 2250 nm, IR holder
- Sample Space Parameters: 1.8 K to 400 K, 0 T to 14 T
High Pressure Cell for Magnetometry
Pressure [P]
- Maximum Sample Pressure: 1.3 GPa
- Diameter: 1.7 mm, 2.2 mm
- Length: 7 mm
Magnetic Moment [m]
- Background Signal: 4 x 10-7 emu/T
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
Torque Magnetometer System Specifications
Torque [τ]
- Noise Floor: 1 x 10-9 N•m (high sensitivity chip); 2 x 10-8 N•m (large moment chip)
- Maximum Torque: 1 x 10-5 N•m (high sensitivity chip); 1 x 10-4 N•m (large moment chip)
- Chip Size: 6 mm x 6 mm x 1 mm
- Available Sample Volume: 1.5 mm x 1.5 mm x 1.5 mm
- Maximum Sample Weight: 10 mg
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
AC Measurement System (ACMS II) Specifications
AC Susceptibility [χ]
- Sensitivity: 1 x 10-8 emu at 10 kHz
- Phase Accuracy: +/- 0.5°
DC Magnetic Moment [m]
- Sensitivity: 5 x 10-6 emu
- Accuracy: +/- 1%
- Amplitude: 5 mOe to 15 Oe (peak)
- Frequency Range: 10 Hz to 10 kHz
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
Thermal Transport (TTO) Specifications
Thermal Conductance [K]
- Typical Accuracy: +/- 5% or +/- 2 μW/K, whichever is greater for T < 15 K; +/- 5 % or +/- 20 μW/K, whichever is greater for 15 K < T < 200 K; +/- 5% or 0.5 mW/K, whichever is greater for 200 K < T < 300 K; +/- 5% or 1 mW/K, whichever is greater for T > 300 K
- Estimated Dynamic Range: 1 mW/K to 25 mW/K for high T = 400 K; 100 μW/K to 100 mW/K for T ~ 50 K; 10 μW/K to 1 mW/K for T ~ 1.9 K
Thermal Conductivity [κ = K•(L/A)]
- Estimated Dynamic Range: 0.1 W/m•K to 250 W/m•K at T = 300 K
Seebeck Coefficient [S]
- Typical Accuracy: Error in S = +/- 5%, or Error in S = +/- 0.5 μV/K or Error in V = +/- 2 μV, whichever is greatest
Estimated Dynamic Range: 1 μV/K to 1 V/K
Resistivity [ρ = R•(L/A)]
- Typical Precision: 0.01% for 1 Ω at 200 μA
- Estimated Dynamic Range: 10 μΩ to 5 MΩ
Thermoelectric Figure of Meric [ZT = T•S2/(κ•ρ)]
- Typical Accuracy: +/- 15% (Assumes +/- 5% accuracy of K and S and negligible contributions from T, ρ)
Speed of Acquisition
- Typical Temperature Slew Rates: +/- 0.5 K/min for T > 20 K; +/- 0.2 K/min for T < 20 K
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
Heat Capacity System Specifications
Heat Capacity [Cp]
- Accuracy: +/- 5% for 2 K to 300 K; +/- < 2% typical
- Resolution: 10 nJ/K at 2 K
- Calorimeter Platform Area (maximum sample footprint) 3 mm x 3 mm
- Typical Addenda Magnitude: 0.2 μJ/K at 2 K; 15 mJ/K at 400 K
- Operational Range: 1.8 K to 400 K, 0 T to 14 T
Helium-3 Refrigerator System Specifications
Temperature Control
- Range: < 0.4 K (0.35 K typical) to 350 K
- Accuracy: +/- 1%
- Stability: +/- 0.2%
Operational Capabilities
- Cooling Power: 6 μW at sample stage at 0.5 K; 80 μW at sample stage at 1 K
- Cool Down Time (300 K to 0.5 K): Less than 3 hours; 2 hours typical
- Operational Range: 0.4 K to 350 K, 0 T to 14 T
Dilution Refrigerator System Specifications
Temperature Control
- Range: 50 mK to 4 K
- Accuracy: +/- 10% for T = 50 mK; +/- 2% for T = 300 mK; +/- 1% at T = 400 mK
- Stability: +/- 0.2% or better
Operational Capabilities
- Cooling Power: 0.25 μW at sample stage at 100 mK
- Cool Down Time (300 K to 50 mK): Less than 8 hours; 5 hours typical
- Space for User Experiments: 22 mm diameter by 35 mm long cylindrical volume
- Operational Range: 0.05 K to 4 K, 0 T to 14 T
Sub-Kelvin Measurements Specifications
Heat Capacity [He-3 and DR]
Identical to previous Heat Capacity Specifications except:
- Typical Addenda Magnitude: 2.5 nJ/K at 0.05 K; 225 nJ/K at 2 K; 1.5 μJ/K at 4 K (Dilution Refrigerator); 10 nJ/K at 0.4 K; 2.25 μJ/K at 4 K; 340 μJ/K at 35 K; 11 mJ/K at 350 K (Helium-3 Refrigerator)
AC [Dilution Refrigerator]
- AC Susceptibility Sensitivity: 5 x 10-7 emu at 10 kHz
- Phase Accuracy: +/- 2°
- Drive Amplitude: 2 mOe to 4 Oe (peak)
- Frequency Range: 10 Hz to 10 kHz
- Operational Range: 0.05 K to 4 K, 0 T to 14 T
Multi-Functional Probes (MFP)
CryoFMR
Heavily modified A-Type intended for spectroscopically probing a material’s ferromagnetic resonance (FMR) response. Includes Helmholtz coils for low-frequency AC field modulation and cryo-coaxial cables for delivery and return of RF signals (886A supports up to 18 GHz RF signals, 886B supports up to 40 GHz). Specialized waveguides orient a thinfilm sample perpendicular or parallel to the DC field. Compatible NanOsc spectrometer also available for a complete integrated measurement option.
Optical Multi-Functional Probe (OMFP)
- Temperature Range: 350 K to 5 K
- Axial Optical Window Coupling Type: SM1 (1” diameter)
- Axial Optical Window Included Coatings: 350 nm to 700 nm, and 650 nm to 1000 nm
- Camera Resolution: < 5 μM
- Maximum Travel: 3 mm (all axes)
- Minimum Step Size: 1 μm to 1 mm (approximately, user-controlled)
- Control Mode: Open Loop
- Operational Range: 0 T to 14 T
Light Sources
TLS120Xe
- Wavelength Range: 280 nm to 1100 nm
- Bandwidth: 20 nm (FWHM)
- Grating Line Density: 1200
- Nominal Blaze Wavelength: 380 nm
- Lamp Type: Short-arc OFR xenon (100 W)
- Lamp Lifetime: 500 hours
MLS Xenon Light Source
- Wavelengths (FWHM): 436 nm (20 nm); 470 nm (40 nm); 500 nm (20 nm); 530 nm (30 nm); 555 nm (20 nm); 585 nm (40 nm); 640 nm (30 nm); 740 nm (40 nm); 850 nm (40 nm)
- Lamp Type: Short-arc xenon (300 W)
Justification of Pre-Selected Supplier:
Supplier: Quantum Design Inc., 10307 Pacific Center Court, San Diego, CA, 92121, United States
Justification:
Many instrument manufacturer can provide systems specialized to measure a single property at a time (optical, electrical, magnetic, etc.). While these systems are enough to measure the properties around which they are designed, they are unable to measure multiple properties. Furthermore, they are not able to simultaneously measure the effects of multiple different parameters on a given sample (e.g. the effect of temperature and/or pressure on the conductive or magnetic properties). To the best of our knowledge, Quantum Design Inc. is the only company capable of providing a system which combines multiple different measurement options, ranging from resistivity, magnetism, pressure, optics, and more. Additionally, Quantum Design Inc. also offer options to see how specific physical properties influence others, through simultaneous application and measurement (e.g. light- or pressure-dependent magnetic measurements, pressure-dependent conductivity measurements).
