BACKGROUND:
The instrument will be used to support research in photonics. Photonics has provided new lasers, imaging techniques and medical devices to diagnose and treat diseases. It is enabling solutions to global challenges, e.g., in energy, communications, and healthcare. The tool to be acquired consists of a spectrophotometer operating from the ultraviolet to the near-infrared to support research in photonics, specifically in materials characterization for nanophotonics and optoelectronics. Notice is hereby given by the University of Ottawa of the intent to enter into a contract with Agilent Technologies to procure a spectrophotometer. The instrument will be integrated into an existing lab in the Advanced Research Complex configured to house such instruments and will be used to characterise materials and surfaces used in photonics research.
PROCESS;
Suppliers who consider their equipment functional, successfully tested, readily available and fully compliant to the ACAN minimum requirements may submit in writing a statement of specifications to the contact person identified in this Notice, on or before the closing date of this Notice. In the statement of specifications, the supplier must unequivocally demonstrate how their equipment, at minimum, equals, or exceeds the stated requirements.
If no other supplier submits a statement of specifications, on or before the closing date of this Notice, the competitive requirements of the University of Ottawa will be considered having been met.
Following notification to suppliers not successful in unequivocally demonstrating that their statement of specifications equals or exceeds the requirements set out in this Notice, the contract may then be awarded to the pre-identified supplier.
Date of issue: February 23, 2023
Closing Date: February 7, 2023, at 3:00:00 P.M. Eastern Standard Time
INTENDED USE:
The spectrophotometer will be used by multiple users to characterize materials and substrates, in reflection and transmission, such as colloidal nanoparticles, structured surfaces, structured materials, fabricated metasurfaces, and plasmonic nanostructures. Dielectric and metallic structures will be characterized on a variety of substrates including on SiO2 and on Si substrates. Sample areas vary from square centimeters to 4-inch diameter wafers.
FUNCTIONALITY:
The equipment must conform to the following Minimum Requirements:
The instrument sought consists of a spectrophotometer. This instrument should be capable of:
- Automated, unattended measurement of absolute reflection and transmission in a single sequence, at variable user defined angle and under s or p polarization, without moving or disturbing the sample;
- Measuring diffusely scattered transmission and reflection with the freedom to control detector and sample position independently;
- Accommodating all sample types, from small to large, including 2” to 4” wafers;
- Delivering angular control of sample rotation (0 - 360 deg) and detector position (10 deg – 350 deg);
- Iindependent angular control over sample rotation, about its axis, and the detector position around the sample - settable to 0.02 deg (20 mili-degree) increments;
- Offering complete control of beam collimation to best suit the sample and measurement needs (incoming beam controllable in vertical and horizontal angles from 3 deg to 1 deg in 1 deg steps and detected beam from 5 deg to 1 deg in 1 deg steps);
- Automated measurements and software featuring simple methods setup, advanced data processing, and 3D graphics;
- Software calculation and reporting interface directly into MicrosoftTM ExcelTM;
- The instrument must operate over the 175 - 3300 nm wavelength range with a spectral resolution of 0.01 - 5.00 nm in the UV-VIS range, and 0.04 - 20 nm in the NIR range;
- Wavelength reproducibility from scan to scan must be +/- 0.025 nm in UV/Vis range and +/- 0.1 nm in NIR range;
- Scanning rate must be for UV/Vis range (<1-2000 nm/min) and NIR range (<1-8000 nm/min);
- Detectors of instrument and accessories must have ability to be internally calibrated for optimum performance.
- Must scan linearly with respect to wavenumber, for equally spaced data points in the entire scan range enable accurate modeling of peaks (especially essential when coupling with external data from other IR measurements)
- Option for automated multisample (up to 32) analysis and profiling of large diameter samples
- Unlimited access to a dedicated Canadian Molecular Spectroscopy Product Specialist for any application question
- Access to toll-free Support telephone line offering services in French and English
Justification of Pre-Selected Supplier:
Supplier: Agilent Technologies
Justification:
This is the only instrument that we have found offering all the features and the performance required for the work to be carried out as proposed in the project.
We investigated the products of the competitors and of other instrument manufacturers and found that none of them have a spectrophotometer that meets our specifications. Operation in reflection and transmission is essential, the operating wavelength range of 175 to 3000 nm is needed, as are variable angle and variable polarisation measurements. Given that the instrument will support fabrication work on wafers, the ability to work with such samples is required.
University Contact:
ALopes
