Background
The suite of surface characterization tools for which proposals are being solicited via this RFP include a large area Atomic Force Microscope (AFM), a white light interferometry system for high precision, non-contact surface characterization of 3D objects, and a stylus surface profilometer. These tools are to be used as part of the nanofabrication toolset in the Quantum NanoFab facility located in the Quantum-Nano Centre, and the quantum research specialty labs located on the University of Waterloo’s north campus. Together these form one of the top emerging research centres in Canada that enables scientists and engineers to pursue frontier research in materials science, nanotechnology, and quantum information processing.
The Quantum NanoFab facility includes ISO 5 and ISO 6 cleanrooms geared towards servicing a wide range of nanofabrication activities for graduate and post-graduate researchers with varying degrees of expertise and experience. As such, all instruments in this facility must be well-proven with many units successfully installed and operating in the field, user friendly, versatile and robust. These instruments must also have a low cost of ownership with proven excellent uptime and reliability.
