2016030-T-1A-RFP - Ultra-High Vacuum, Low Temperature, Scanning Tunneling Microscope

This Request for Proposal (“RFP”) is an invitation by the University to prospective Proponents to submit Proposals for the provision of an ultra-high vacuum (UHV), low temperature (LT), scanning tunneling microscope (STM), including installation and on-site training. Proponents should also, if possible, provide optional pricing for a preparation chamber and accessories, magnet upgrade, atomic force microscope (AFM) and extended warranties in the Options section of the Appendix H – Price Schedule.

This instrumentation will allow the acquisition of atomic resolution topographic measurements as well as spectroscopy with meV resolution, both key features that will allow material characterization with detailed information at the atomic scale about the morphology (STM) and about the electronic band structure (STS). Furthermore, the system is under ultra-high vacuum, which is necessary for achieving such high resolution but also allows for sample preparation and pristine sample quality. The system will be operating under low temperatures (LT).The LT capability will not only further improve resolution, but it will allow access to physical phenomena that only happen at low temperatures (superconductivity, molecular assembly etc.). To achieve optimal operation conditions the instrument is equipped with appropriate vibration isolation.