Information de base

Numéro de référence

0000271691

Organisation émettrice

University of Ottawa

Organisation propriétaire

University of Ottawa

Type d’appel d’offres

DDP - Demande de proposition (Formel)

Numéro d’appel d’offres

43034-1A-RFP

Titre

IN-SITU (SCANNING ELECTRON MICROSCOPE (SEM)) NANO-MECHANIC TESTING EQUIPMENT

Code d’identité d’origine

PU.AC.ON.11752.C94742

Types d’accord

Accord de libre-échange canadien (ALÉC)

Approvisionnement dans le secteur parapublic

Détails

Emplacement

Canada, Ontario, Région de la capitale nationale

Point de livraison

TBD

Type d’achat

Une seule fois- Date de livraison:TBD

Description

1. 1. The Unversity of Ottawa is pleased to invite qualified proponents to submit a proposal for an in-situ nano-mechanic testing equipment for the uOttawa Cold Spray Lab which will allow:

Mechanical testing in tension and compression using position control without force control loop and the ability to record events linked to the deformation and rupture of materials in terms of amplitudes and frequency without system-related measurement artifacts.

Standard and high-frequency Continuous Stiffness Measurement (CSM) nano indentation testing, as well as mapping of the hardness and elastic modulus of materials using both methods.

Proposals must include on-site delivery and installation of the system, training and on-site performance demonstration of all features described in this document.

General Description:

This in situ nano-mechanical testing system which must be installed in a SEM without hindering the normal use of other equipment present in the latter. It must adapt to the SEM goniometric stage and allow adjustment to height (z) using the standard movements of this stage. All elements necessary for the installation of the system in the SEM as well as the passage of connectors through the free ports of the SEM must be included in the offer.

The force ranges in which it must operate are between l nN and 2 N. The system must impose movement control without resorting to a force control loop. The system must offer force and strain rate control. The nano mechanical testing system must have 3 degrees of freedom (x,y, z) for sample alignment. All movements must be motorized and all positioning axes equipped with optical position encoders for direct position measurement. Movements in the loading axis must include approach positioning of the sample and fine positioning.

The instrument must offer a piezoelectric scanner for the actuation of continuous movement during the tests.

The in situ nano mechanical testing system must offer the possibility of easily changing the force measurement elements in order to adapt the test configuration to different scales. To adapt to microscopic scales, the system must offer a range of force available up to at least 2N (Newton). To adapt to nanometric scales, the system must make it possible to achieve the lowest possible background noise in force measurement .

The system should include a wide series of tips allowing in situ SEM testing of micro-pillar compression, micro-traction and nano indentation and CSM nano indentation at high resolution.

The equipment will be used in the SEM of the uOttawa Cold Spray Laboratory, located in room CBY-A210.

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Dates

Publication

2024-06-05 15h46:38 HAE

Intention de soumissionner

Non disponible

Échéance de la réception des questions

2024-06-12 15h00:00 HAE

Questions sont soumises en ligneA - Dernier rectificatif

Oui

Date de fermeture

2024-06-20 15h00:00 HAE

Information du contact

Ana Lopes

613-562-5800 ext. 2312

alopes@uottawa.ca

Préférences, directives ou exigences de l’acheteur

Exigences générales

- Installation requise

- Assurances requises

- Formation requise

- Information sur la garantie obligatoire

Processus de soumission

Type de soumission

Soumission électronique

Fixation des prix

Dans un document attaché

Liste de documents de la soumission

Nom de l’item	Description	Obligatoire	Limité à un fichier
Attachment #1	Technical/Qualitative Proposal and supporting documents as listed in section 2.3.3 in the RFP document	Oui	Non
Attachement #2	Financial Proposal and supporting documents as listed in section 2.3.4 in the RFP document	Non	Non
Aucune entrée

Directives additionelles d’appel d’offres

1. - Proposals Submitted Only In Prescribed Manner

1. 1. The Proponent’s proposal must be submitted in the following manner:

1. 1. The Proponents must submit their proposal using Merx EBS no later than the time and date stated in section 2.2 – Timetable. No other forms of delivery will be accepted by the University.

The proposals must be complete and submitted in the prescribed format with the following information:

1. 1. The Proponent must provide two (2) separate attachments (files) containing the Proponent’s proposal labelled in the following manner:

Attachment #1 Technical/Qualitative Proposal: 43034-1A-RFP- Signal source analyzer (single channel)

Attachment #2 Financial Proposal: 43034-1A-RFP- Signal source analyzer (single channel)

Attachment #1 – Technical/Qualitative Proposal must include the following mandatory documents:

Appendix A (Technical Specifications Compliance)
Appendix B (Rated Criteria)
Appendix C (Equipment, Utility, and Environmental Requirements) and all the referenced associated documents
Appendix D (Supplemental Information)
Appendix E (Reference Consent Form)
Appendix F (Submission Declaration Form)
Appendix I (Proponent’s Checklist Form)
All supporting technical documentation for the proposal
Detailed quotation without pricing
Bottom of every page of RFP initialled

1. 1. Attachment #2 – Financial Proposal must include the following mandatory documents:

Appendix G (Pricing Structure Form)
Appendix H (Price Schedule Form)
Detailed quotation with pricing

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