36387-5B-ACAN - Atomic Force Microscope

Notice is hereby given by the University of Ottawa of the intent to purchase (Subject to budget approval) from Oxford Instruments Asylum Research a Cypher S AFM system to image the topography of a mesoscopically smooth surface with sub-nanometer resolution over microscopic areas. For this purpose the interaction of an extremely fine tip mounted on a miniature cantilever is monitored. Due to the extremely small scale of the topography and the forces involved, a high degree of mechanical control is required in both lateral and vertical dimensions. In addition to topographical data, modifications of the tip cantilever geometry allow finely localized characterization of other surface parameters, such as temperature, conductivity or magnetic susceptibility. Further modifications allow nanolithographical functionality, by applying an electric potential across the tip or usage of specialized tips that allow more effective sample abrasion.