Center for Hybrid Interfaces and Intelligent Thin-Films (HIIT) is a partnership between academia and industry to bring transformational advances in hybrid thin films and devices as well as convergence with more established technologies such as bulk semiconductors. HIIT will accelerate the translation from materials development to prototype production by providing world-class expertise and infrastructure required to tailor and process advanced hybrid thin films and interfaces. Understanding the interactions between thin films of various hybrid materials, such as organic-inorganic, organic-metal, and high throughput, low-cost, and low-power consumption roll-to-roll (R2R) manufacturing approaches will offer Canada and the world revolutionary innovations in technology that will bring tremendous positive economic, health, social, and environmental impacts. Innovations include the state-of-the-art device analsys by semiconductor analyzer which allows current range from less than 1 pA up to 10 mA with ultra-precision current measurement along with applied voltage. This semiconductor analyzer allows various types of devices including field effect transistor, sensors, memory devices, solar cells, and light emitting diodes that is well-aligned with HIIT project.
Mandatory Requirements:
1. Semiconductor Parameter Analyzer
1.1 The instrument must provide voltage source up to 100 V.
1.2 The instrument must provide current reading at up to 100 mA
1.3 The instrument must measure the current to less than 10 pA
1.4 The instrument must have at least one preamplifier that is capable of detecting a current of less than 1 pA.
1.5 The machine must provide capabilities to test variety of samples including metal, semiconductor and insulators
1.6 The machine must be capable of measuring thin-film devices including metal oxide transistors, sensors, bipolar transistors, non-volatile memory devices, solar cells, organic light emitting diodes.
1.7 The instrument must include at least 3 voltage source units.
1.8 The current fluctuation must be ±10 pA, or less, during the measurement.
1.9 The capacitance measurement as a function of voltage must be up to 5 MHz, or better , with a minimum of 5 KHz resolution.
1.10 Data obtained from this machine must be saved as a excel, text, or a chart format with 3 decimal accuracy or better.
1.11 Temperature and humidity effect oncurrent accuracy must not be over 1 mA up to 35 oC and RH 70%.
1.12 The instrument must be bench top and must be stand alone with dimensions not exceeding 0.7m (H) x 0.7 m(W) x 0.7 m(D). The total weight cannot exceed 50 kg.
2. Warranty, Installation, and Training
2.1 Must include 1-year standard manufacturer’s warranty; including virtual technical support or better.
2.2 Must include installation and on-site training.
2.3 Software must be compatible with Windows
2.4 Proponent must be capable of providing up to a total of 5 years of warranty.
